FROM
THE EDITOR
This week, we have a score to settle. We’re firin’ up the ol’ ’68, taking it out on the backroads, and givin’ them other guys the what-for! We’re sick and tired of FPGA companies having all the fun announcing a new process node, so we decided to just up and stick it to ‘em this time. Our latest feature has the details.
Our second feature is a contributed article from Brian Caslis at Lattice Semiconductor. Brian gives us the low-down on embedded logic analyzers and how to use them in debugging our FPGA designs.
Thanks for reading! If there's anything we can do to make our
publications more useful to you, please let us know at:
comments@fpgajournal.com. If you'd rather sound off in public, please post your comments or questions in our new Journal Forums.
Kevin Morris – Editor
FPGA and Structured ASIC Journal
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45nm Chicken
We Win
The swamp screams loudly around the abandoned road as the jousters position themselves for their impending bout. Somewhere, in the back of their alcohol-soaked brains, they visualize themselves as medieval warriors mounting their steeds in a duel of chivalrous wit. In the real world, their decrepit death-trap pickup trucks are a far cry from the mounts they mentally mimic, and the assembled audience of mosquitoes, flies, and the occasional bullfrog hardly constitutes the cheering throngs envisioned by these imbecilic soldiers of the sullen South.
With a final swig from their respective flasks of courage and a hearty “Yeee Haaa!!!” [more]
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Effectively Using Internal Logic Analyzers for Debugging FPGAs
by Brian Caslis,
Lattice Semiconductor Corporation
Factors Driving Change in FPGA Debugging Techniques
The ability to reprogram an FPGA has been a key benefit during the functional debug of a hardware design. If the design is not working correctly, the ability to add “debug hooks” has been used by engineers since the earliest use of CPLDs and FPGAs. Initially, signals internal to the FPGA that needed to be observed were brought out to pins and then external logic analyzers were used to capture the data. However, as design complexity and size have increased, this approach is no longer adequate for several reasons. [more]
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